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Built for perfection
Leading fine detail
Robust interface
Heat consistency
Flexible unit
Our systems deliver sub-micron precision for the toughest semiconductor test environments.
These probe cards are engineered to survive arduous high-volume assembly periods.
Advanced heat regulation maintains reliable operation through all test temperature ranges.
Adaptable modular designs enable rapid changes to accommodate evolving testing specifications.
What we do
We make wafer probe stations and cantilever probe cards. Both are manufactured in Sandy, Bedfordshire, and supported by a team with decades of hands-on experience in semiconductor test.
If something goes wrong, we're reachable. If you need something custom, we'll work with you to build it.
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